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Computed Tomography on Electronic Components



Computed Tomography on Electronic Components
The combination of improved computers, detectors, and new software has allowed the addition of a fourth dimension to a computed tomography data set.
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Authored By:


Wesley F. Wren
North Star Imaging
Rogers, MN, USA

Summary


In the decade past, Computed Tomography has been an underutilized modality. With the exceptions of failure or quality issues related to safety critical or very expensive components, CT was seldom used. Use of computed tomography systems in the industrial market continues to rise.

This recent Shift in paradigm has been attributed to the technologic advances made in digital detectors, new scintillators, better resolution, faster frame rates, and improved bit depth. Most crucial to the growth of computed tomography systems have been the evolutions of better computers, utilization of graphic processing units, along with user friendly software. The proliferation of technology and popularity has allowed the cost of equipment to go down while the acquisition and scan times have dramatically improved.

The new detector technology and computers have allowed for scanning of low density materials inside denser packages that have been almost impossible in the past. This has really opened some doors on what can be done to monitor and understand the integrity of bond wires and via's in electrical components that are being manufactured with aluminum.

Conclusions


Computed tomography is a valuable tool that is growing in use and functionality for many applications. With the ever increasing capabilities of computers and the advancements of the detector technology it is clear that CT will continue to see increases in speed, contrast sensitivity, and special resolution. These improvements will allow for better imaging of smaller products with a faster through put time. Do to this many industries and companies will be looking into CT technology as the return on investment improves with more and better data.

4D CT will begin to play a much larger role in the learning more about the functionality of parts, and different processes. Applications in areas never thought of before will begin to be explored with this technology.

Initially Published in the SMTA Proceedings

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