Authored By:
Louis Hart, Russell Dudek and Brent Mayfield
Compunetics, Inc.
Summary
We describe the design of a novel test structure, to which we have given the name "HD", that will facilitate the evaluation of blind and buried microvias in printed circuit boards, in comparison with existing, standard test coupons. HD will consume less board space than and be, at least in the case of blind vias, more representative of realistic board structures than standard coupons.
Initially Published in the IPC Proceedings
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