Electronics Assembly Knowledge, Vision & Wisdom
Maximizing the Value of Automatic Inspection
Maximizing the Value of Automatic Inspection
Learn about the role of automatic inspections, SPI data mining, typical SMT process defects, and more in this presentation by Chrys Shea, Christopher Associates.
Production Floor

Authored By:
Chrys Shea
Christopher Associates, Inc.
Santa Ana, CA USA
,{url:'http://www.circuitinsight.com/videos/maximizing_value_automatic_inspection.mp4'},{url:'http://www.circuitinsight.com/videos/programs_final.mp4'}], clip:{autoBuffering:true, autoPlay:true, scaling:'scale' } }).ipad();
Initially Published in the IPC Proceedings
Reader Comment

Great presentation. So many are still focusing on ATE and the end of the line. Makes so much sense to look for and find errors at the front.

Juan Arocho, CTU
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