Learn about the role of automatic inspections, SPI data mining, typical SMT process defects, and more in this presentation by Chrys Shea, Christopher Associates. Analysis Lab
Authored By:
Chrys Shea
Christopher Associates, Inc.
Santa Ana, CA USA
Initially Published in the IPC Proceedings
Comments
Great presentation. So many are still focusing on ATE and the end of the line. Makes so much sense to look for and find errors at the front.
